Advances in X-Ray Analysis - Barrett, Charles S. / Cohen, jerome B. / Faber, Jr., John / Jenkins, Ron / Leyden, Donald E. / Russ, John C. / Predecki, Paul K. (Hgg.)
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Produktdetails
  • Verlag: Springer, Berlin
  • 1986
  • Seitenzahl: 622
  • Erscheinungstermin: 30. Juni 1986
  • Englisch
  • Abmessung: 241mm x 160mm x 38mm
  • Gewicht: 1087g
  • ISBN-13: 9780306422874
  • ISBN-10: 0306422875
  • Artikelnr.: 21675251
Inhaltsangabe
'I. Trends in XRF: A World Perspective (Plenary Session).- XRF in North America.- X-Ray Fluorescence Analysis (XRF) in Europe.- XRF in Japan and China.- Personal Observations.- Personal Observations.- II. XRF Techniques and Instrumentation.- X-Ray Microfluorescence of Geologic Materials.- Parameters Affecting X-Ray Microfluorescence (XRMF) Analysis.- Imaging Techniques for X-Ray Fluorescence and X-Ray Diffraction.- X-Ray Microanalysis for Alloy Design.- High Spatial Resolution in X-Ray Fluorescence.- Low Level Iodine Detection by TXRF in a Reactor Safety Simulation Experiment.- Robotic Automation Applied to X-Ray Fluorescence Analysis.- III. XRF Fundamental Parameters and Data Analysis.- Advances in Fundamental-Parameter Methods for Quantitative XRFA.- X-Ray Fluorescence Analysis of Geological Materials Using Rousseau's Fundamental Algorithm.- Application of the Inverse Monte Carlo Method to Energy-Dispersive X-Ray Fluorescence.- Monte Carlo Simulation of the X-Ray Fluorescence Spectra From Multielement Homogeneous and Heterogeneous Samples.- Quantitative Analysis of Odd-Shaped Samples by X-Ray Fluorescence Spectrometry Using Intensity Ratios.- Background Intensities and their Utilization in Quantitative Analysis by Monochromatically Excited Energy-Dispersive X-Ray Fluorescence.- Standardless EDXRF Analysis of Cations in Ion-Exchange Resin-Impregnated Membrances.- Use of Scattered Secondary Target Radiation in EDXRF Analysis: A Fundamental-Parameter Method for Matrix Correction.- Comparison of Dilution Strategies for Dealing with Unanalyzed Elements in X-Ray Fluorescence Analyses.- IV. Recent Developments in XRF Dispersion Devices.- The Use of Layered Synthetic Microstructures for Quantitative Analysis of Elements: Boron to Magnesium.- The Analysis of Carbon and Other Light Elements Using Layered Synthetic Microstructures.- Layered Synthetic Microstructure in Sequential and Simultaneous X-Ray Spectrometry.- Measurement of Soft and Ultrasoft X-Rays With Total Reflection Monochromator.- Comparison of Dual-Channel Wavelength and Secondary-Target Energy-Dispersive X-Ray Spectrometers.- V. XRF Applications; Fuels and Lubricants, Metals and Alloys, Geological, Heavy Element, other.- The Efficiency of the Recessed Source Geometry for EDXRF Analysis of Metal Impurities in Oils.- X-Ray Fluorescence Analysis of Sulfur and Trace Elements in Coal and Oil Tar Pitches, Asphalts and Other Bituminous Compounds.- A Comparison of Several Sample Preparation Techniques for the Analysis of Fly Ash.- Advances in High-Resolution Studies of the Chemical Effects in the Molybdenum L Heavy-Ion-Induced X-Ray Satellite Emission (HIXSE) Spectra.- Energy Dispersive Analysis for Quality Assurance of Aluminum Alloys.- Multielement Preconcentration of Rare Earth Elements for their Determination at ppm-Levels in Geological Samples.- Wide Area Networking of XRF Generated Geochemical Data in a National Geological Survey.- Energy-Dispersive X-Ray Techniques for Accurate Heavy Element Assay..- Applications of X-Ray Fluorescence Scans of Single Strands of Hair: Actual and Potential.- Application of EDXRF Analysis to Continuous Industrial Process Monitoring.- X-Ray Fluorescence Determination of Trace Elements in Complicated Matrices.- An X-Ray Fluorescent Spectrometer for the Measurement of Thin Layered Materials on Silicon Wafers.- Automated Quantitative XRF Analysis of Soda-Lime Glass Utilizing Pattern Recognition.- VI. Quantitative Phase Analysis by XRD.- The Use of Mass Absorption in Quantitative X-Ray Diffraction Analysis.- Powder Diffraction Profiles and the Pearson VII Distribution.- Observed and Calculated XRPD Intensities for Single Substance Specimens.- Rapid Non-Destructive X-Ray Characterization of Solid Fuels/Propellents.- On-Stream X-Ray Diffraction Analyzer for Mineral Concentrators.- VII. Synchrotron and Neutron Diffraction.- Lattice Parameter Determinat