Radiation Effects on Embedded Systems - Velazco, Raoul / Fouillat, Pascal / Reis, Ricardo (eds.)
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Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today s applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005. This book will provide all IC engineers with useful information regarding outside…mehr

Produktbeschreibung
Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today s applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005.
This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs and is an excellent reference.
  • Produktdetails
  • Verlag: Springer Netherlands
  • Artikelnr. des Verlages: 11799306
  • Erscheinungstermin: 4. Juni 2007
  • Englisch
  • Abmessung: 244mm x 164mm x 25mm
  • Gewicht: 572g
  • ISBN-13: 9781402056451
  • ISBN-10: 1402056451
  • Artikelnr.: 20947221
Autorenporträt
Raoul Velazco, TIMA Laboratory, Grenoble, France / Pascal Fouillat, Université Bordeaux 1, France / Ricardo Reis, Universidade Federal do Rio Grande do Sol, Porto Alegre, Brazil
Inhaltsangabe
1- Space Radiation Environment, J.-C. Boudenot (THALES) 2- Radiation Effects in Microelectronics, R. Schrimpf (Vanderbilt Univ. ) 3- In-Flight Anomalies on Electronic Devices, R. Ecoffet (CNES) 4- Multi-Level Fault Effects Evaluation, L. Anghel (TIMA), M. Rebaudengo, M. Sonza Reorda, M. Violante (POLI Torino) 5- Effects of Radiation on Analog & Mixed-Signal Circuits, M. Lubaszewski, T. Balen, E. Schuler, L.Carro (UFRGS), J.L. Huertas (IMSE-CNM) 6- Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing , P. Fouillat, V. Pouget (IXL), D. McMorrow (NRL). F. Darracq (IXL), S. Buchner (QSS), D. Lewis (IXL) 7- Design Hardening Methodologies for ASICs , F. Faccio (CERN) 8- Fault Tolerance in Programmable Circuits, F. Kastensmidt (UFRGS) & R. Reis (UFRGS) 9- Automatic Tools for Design Hardening, C. Lopez-Ongill, L. Entrena, M. Gracia-Valderas, M. Portela-Garcia (Univ. Carlos III) 10- Test Facilities for SEE and Dose Testing, S. Duzellier (ONERA) and G. Berger (UCL) 11-