Greg Haugstad

Atomic Force Microscopy

Understanding Basic Modes and Advanced Applications

• Gebundenes Buch

Produktbeschreibung

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.

"Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com"

Produktdetails

• Verlag: Wiley & Sons
• 1. Auflage
• Seitenzahl: 496
• Erscheinungstermin: 24. September 2012
• Englisch
• Abmessung: 241mm x 215mm x 32mm
• Gewicht: 754g
• ISBN-13: 9780470638828
• ISBN-10: 0470638826
• Artikelnr.: 32735740

Autorenporträt

GREG HAUGSTAD, PhD, is a technical staff member and Director of the Characterization Facility in the College of Science and Engineering at the University of Minnesota. He has collaborated with industry professionals on such technologies as medical X-ray imaging media, lubrication, inkjet printing, and more recently on biomedical device coatings. He teaches undergraduate and graduate AFM courses, as well as short professional courses, and has trained over 600 AFM users.

Inhaltsangabe

Preface xiii Acknowledgments xxi 1. Overview of AFM 1 1.1. The Essence of the Technique
1 1.2. Property Sensitive Imaging: Vertical Touching and Sliding Friction
6 1.3. Modifying a Surface with a Tip
13 1.4. Dynamic (or "AC" or "Tapping") Modes: Delicate Imaging with Property Sensitivity
16 1.5. Force Curves Plus Mapping in Liquid
21 1.6. Rate
Temperature
and Humidity-Dependent Characterization
24 1.7. Long-Range Force Imaging Modes
28 1.8. Pedagogy of Chapters
30 References
31 2. Distance-Dependent Interactions 33 2.1. General Analogies and Types of Forces
33 2.2. Van der Waals and Electrostatic Forces in a Tip-Sample System
38 2.2.1. Dipole-Dipole Forces
38 2.2.2. Electrostatic Forces
41 2.3. Contact Forces and Mechanical Compliance
44 2.4. Dynamic Probing of Distance-Dependent Forces
51 2.4.1. Importance of Force Gradient
51 2.4.2. Damped
Driven Oscillator: Concepts and Mathematics
56 2.4.3. Effect of Tip-Sample Interaction on Oscillator
60 2.4.4. Energy Dissipation in Tip-Sample Interaction
64 2.5. Other Distance-Dependent Attraction and Repulsion: Electrostatic and Molecular Forces in Air and Liquids
67 2.5.1. Electrostatic Forces in Liquids: Superimposed on Van der Waals Forces
67 2.5.2. Molecular-Structure Forces in Liquids
69 2.5.3. Macromolecular Steric Forces in Liquids
72 2.5.4. Derjaguin Approximation: Colloid Probe AFM
76 2.5.5. Macromolecular Extension Forces (Air and Liquid Media)
78 2.6. Rate/Time Effects
83 2.6.1. Viscoelasticity
84 2.6.2. Stress-Modified Thermal Activation
85 2.6.3. Relevance to Other Topics of Chapter 2
86 References
88 3. Z-Dependent Force Measurements with AFM 91 3.1. Revisit Ideal Concept
91 3.2. Force-Z Measurement Components: Tip/Cantilever/Laser/Photodetector/Z Scanner
93 3.2.1. Basic Concepts and Interrelationships
93 3.2.2. Tip-Sample Distance
96 3.2.3. Finer Quantitative Issues in Force-Distance Measurements
99 3.3. Physical Hysteresis
106 3.4. Optical Artifacts
109 3.5. Z Scanner/Sensor Hardware: Nonidealities
113 3.6. Additional Force-Curve Analysis Examples
118 3.6.1. Glassy Polymer
Rigid Cantilever
118 3.6.2. Gels
Soft Cantilever
123 3.6.3. Molecular-Chain Bridging Adhesion
126 3.6.4. Bias-Dependent Electrostatic Forces in Air
129 3.6.5. Screened Electrostatic Forces in Aqueous Medium
131 3.7. Cantilever Spring Constant Calibration
133 References
135 4. Topographic Imaging 137 4.1. Idealized Concepts
138 4.2. The Real World
143 4.2.1. The Basics: Block Descriptions of AFM Hardware
143 4.2.2. The Nature of the Collected Data
149 4.2.3. Choosing Setpoint: Effects on Tip-Sample Interaction and Thereby on Images
156 4.2.4. Finite Response of Feedback Control System
162 4.2.5. Realities of Piezoscanners: Use of Closed-Loop Scanning
167 4.2.6. Shape of Tip and Surface
180 4.2.7. Other Realities and Operational Difficulties--Variable Background
Drift
Experimental Geometry
182 References
186 5. Probing Material Properties I: Phase Imaging 187 5.1. Phase Measurement as a Diagnostic of Interaction Regime and Bistability
189 5.1.1. Phase (and Height
Amplitude) Imaging as Diagnostics
189 5.1.2. Comments on Imaging in the Attractive Regime
200 5.2. Complications and Caveats Regarding the Phase Measurement
202 5.2.1. The Phase Offset
202 5.2.2. Drift in Resonance Frequency
Phase Offset
Quality Factor
and Response Amplitude
207 5.2.3. Change of Phase and Amplitude During Coarse Approach
211 5.2.4. Coupling of Topography and Phase
214 5.2.5. The Phase Electronics and Its Calibration
221 5.2.6. Nonideality in the Resonance Spectrum
230 5.3. Energy Dissipation Interpretation of Phase: Quantitative Analysis
234 5.3.1. Variable A/A0 Imaging
235 5.3.2. Fixed A/A0 Imaging
240 5.3.3. Variable A/A0 via Z-Dependent Point Measurements
243 5.4. Virial Interpretation of Phase
247 5.5. Caveats and Data Analysis Strategies when Quantitatively Interpreting Phase Data
248 References
255 6. Probing Material Properties II: Adhesive Nanomechanics and Mapping Distance-Dependent Interactions 258 6.1. General Concepts and Interrelationships
259 6.2. Adhesive Contact Mechanics Models
261 6.2.1. Overview and Disclaimers
261 6.2.2. JKR and DMT Models
263 6.2.3. Ranging Between JKR and DMT: The Transition Parameter l
266 6.2.4. The Maugis-Dugdale Model
270 6.2.5. Other Formal Relationships Relevant to Adhesive Contact Mechanics
273 6.2.6. Summary Comments and Caveats on Adhesive Contact Mechanics Models
274 6.3. Capillarity
Details of Meniscus Force
277 6.3.1. Framing the Issues
278 6.3.2. Basic Elements of Modeling the Meniscus
280 6.3.3. Mathematics of Meniscus Geometry and Force
283 6.3.4. Experimental Examples of Capillarity
287 6.3.5. Capillary Transfer Phenomena: Difficulties and Opportunities
293 6.4. Approach-Retract Curve Mapping
296 6.4.1. Motivation and Background
296 6.4.2. Traditional Force-Curve Mapping
298 6.4.3. Approach-Retract Curve Mapping in Dynamic AFM
306 6.4.4. Approach-Retract Curve Mapping of Liquidy Domains in Complex Thin Films
313 6.5. High-Speed/Full Site Density Force-Curve Mapping and Imaging
315 6.5.1. Liquidy Domains in Complex Thin Films
317 6.5.2. PBMA/PLMA Blend at Variable Ultimate Load
319 6.5.3. PBMA/Dexamethasone Mixture at Variable Temperature
320 6.5.4. Arborescent Styrene-Isobutylene-Styrene Block Copolymer Plus Drug Rapamycin
322 6.5.5. Comments on "Force Modulation" Mode
323 References
324 7. Probing Material Properties III: Lateral Force Methods 330 7.1. Components of Lateral Force Signal
330 7.2. Application of Lateral Force Difference
336 7.3. Calibration of Lateral Force
343 7.4. Load-Dependent Friction
346 7.4.1. Motivations
346 7.4.2. Load Stepping and Ramping Methods
347 7.5. Variable Rate and Environmental Parameters in AFM Friction and Wear
352 7.5.1. Motivations
352 7.5.2. Interplay of Rate
Temperature
Humidity
and Tip Chemistry in Friction
354 7.5.3. Wear Under Variable Rate and Temperature
359 7.5.4. Musings on the Spectroscopic Nature of Friction and Other Measurements
362 7.6. Transverse Shear Microscopy (TSM) and Anisotropy of Shear Modulus
364 7.7. Shear Modulation Methods
366 7.7.1. Motivations and Terminology
366 7.7.2. Shear Modulation During 1D Lateral Scanning
368 7.7.3. Diagnostics of Sliding Under Shear Modulation
371 7.7.4. Complementarity of Shear Modulation Methods to TSM
372 7.7.5. Shear Modulation Within Force Curves: Material Creep
373 References
375 8. Data Post-Processing and Statistical Analysis 379 8.1. Preliminary Data Processing
379 8.2. 1D Roughness Metrics
383 8.3. 2D-Domain Analysis
385 8.3.1. Slope and Surface Area Analysis
385 8.3.2. 2D-Domain Fourier Methods for Spatial Analysis
386 8.3.3. Fourier Methods for Time-Domain Analysis
391 8.3.4. Grain or Particle Size Analysis
394 8.4. "Lineshape" Fitting
396 References
398 9. Advanced Dynamic Force Methods 400 9.1. Principles of Electronic Methods Utilizing Dynamic AFM
401 9.1.1. Shifted Dynamic Response due to Force Gradient
402 9.1.2. Interleave Methods for Long-Range Force Probing
405 9.1.3. Interleave-Based EFM/KFM on Different Metals and Silicon
408 9.1.4. KFM of Organic Semiconductor
Including Cross-Technique Comparisons
412 9.2. Methods Using Higher Vibrational Modes
414 9.2.1. Mathematics of Beam Mechanics: The Music of AFM
414 9.2.2. Probing Tip-Sample Interactions via Multifrequency Dynamic AFM
419 9.2.3. Contact Resonance Methods
425 9.2.4. Single-Pass Electric Methods
429 References
433 Appendices 437 Appendix 1: Spectral Methods for Measuring the Normal Cantilever Spring Constant K
437 A1.1 Plan-View/Resonance Frequency Method
438 A1.2 Sader Method
441 A1.3 Thermal Method
442 Appendix 2: Derivation of Van der Waals Force-Distance Expressions
443 Appendix 3: Derivation of Energy Dissipation Expression
Relationship to Phase
447 Appendix 4: Relationships in Meniscus Geometry
Circular Approximation
449 References
450 Index 453