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  • Gebundenes Buch

This book is a blend of analytical methods based on the phenomenon of atomic and nuclear physics. It comprises comprehensive presentations about X-ray Fluorescence (XRF), Mössbauer Spectroscopy (MS), X-ray Photoelectron Spectroscopy (XPS), Neutron- Activation Analysis (NAA), Particle Induced X-ray Emission Analysis (PIXE), Rutherford Backscattering Analysis (RBS), Elastic Recoil Detection (ERD), Nuclear Reaction Analysis (NRA), Particle Induced Gamma-ray Emission Analysis (PIGE), and Accelerator Mass Spectrometry (AMS). These techniques are commonly applied in the fields of medicine, biology,…mehr

Produktbeschreibung
This book is a blend of analytical methods based on the phenomenon of atomic and nuclear physics. It comprises comprehensive presentations about X-ray Fluorescence (XRF), Mössbauer Spectroscopy (MS), X-ray Photoelectron Spectroscopy (XPS), Neutron- Activation Analysis (NAA), Particle Induced X-ray Emission Analysis (PIXE), Rutherford Backscattering Analysis (RBS), Elastic Recoil Detection (ERD), Nuclear Reaction Analysis (NRA), Particle Induced Gamma-ray Emission Analysis (PIGE), and Accelerator Mass Spectrometry (AMS). These techniques are commonly applied in the fields of medicine, biology, environmental studies, archaeology or geology et al. and pursued in major international research laboratories.
This book compares and offers a comprehensive overview of nine analytical techniques important in material science and many other branches of science. All these methods are already well adapted to applications in diverse fields such as medical, environmental studies, archaeology, and materials science. This clearly presented reference describes and compares the principles of the methods and the various source and detector types.
  • Produktdetails
  • Verlag: Springer / Springer Berlin Heidelberg / Springer, Berlin
  • Artikelnr. des Verlages: 10908259
  • 2007
  • Seitenzahl: 220
  • Erscheinungstermin: 2. Mai 2007
  • Deutsch, Englisch
  • Abmessung: 246mm x 164mm x 32mm
  • Gewicht: 706g
  • ISBN-13: 9783540302773
  • ISBN-10: 3540302778
  • Artikelnr.: 20743150
Autorenporträt
Hem Raj Verma, Punjabi University, Patiala, India
Inhaltsangabe
X-ray Fluorescence (XRF) and Particle-Induced X-ray Emission (PIXE).- Rutherford Backscattering Spectroscopy.- Elastic Recoil Detection.- Mössbauer Spectroscopy (MS).- X-Ray Photoelectron Spectroscopy.- Neutron Activation Analysis.- Nuclear Reaction Analysis and Particle-Induced Gamma-Ray Emission.- Accelerator Mass Spectrometry (AMS).
Rezensionen
From the reviews:

"This book covers a range of atomic and nuclear analytical methods ... . In summary this is an excellent undergraduate book for low energy applied physics applications. It is well written, very easy to read and should appeal to both the novice wanting to understand sufficient detail to able to apply these techniques and the expert looking for a concise but accurate summary of a broad range of common atomic and nuclear analytical methods. It is an excellent reference book for the field." (David Cohen, Australian Physics, Vol. 44 (4), 2007)

"This excellent book covers nondestructive analytical techniques based on atomic and nuclear physics. ... Additional coverage of sampling techniques via neutron activation analysis and accelerator mass spectrometry provides the researcher with valuable resources. For each nondestructive technique, the author provides the reader with concepts, theory and experiments with instrumentation. His target audience is research students." (Axel Mainzer Koenig, Optics and Photonics News, April, 2008)