VLSI Design and Test (eBook, PDF)

21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
Redaktion: Kaushik, Brajesh Kumar; Singh, Virendra; Dasgupta, Sudeb

• Format: PDF

Produktbeschreibung

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

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Produktdetails

• Verlag: Springer-Verlag GmbH
• Seitenzahl: 815
• Erscheinungstermin: 21. Dezember 2017
• Englisch
• ISBN-13: 9789811074707
• Artikelnr.: 53057590

Inhaltsangabe

Digital design.- Analog/mixed signal.- VLSI testing.- Devices and technology.- VLSI architectures.- Emerging technologies and memory.- System design.- Low power design and test.- RF circuits.- Architecture and CAD.- Design verification.