Yongke Sun, Scott E. Thompson, Toshikazu Nishida

Broschiertes Buch

Strain Effect in Semiconductors

Theory and Device Applications

Beschreibung

Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.

Produktdetails

• Verlag: Springer / Springer US / Springer, Berlin
• Artikelnr. des Verlages: 978-1-4899-8315-2
• 2010
• Seitenzahl: 364
• Erscheinungstermin: 20. November 2014
• Englisch
• Abmessung: 235mm x 155mm x 20mm
• Gewicht: 557g
• ISBN-13: 9781489983152
• ISBN-10: 1489983155
• Artikelnr.: 41857780