Head, A. K., P. Humble, L. M. Clarebrough, A. J. Morton and C. T. Forwood.

Buch

Computed electron micrographs and defect identification.

Beschreibung

Computed electron micrographs and defect identification.

Produktdetails

• Verlag: Amsterdam, North-Holland Publ. Comp. 1973.
• ISBN-13: 9780720417579
• Artikelnr.: 42928237