Ch Sateesh Kumar (South Africa University of Johannesburg), M. Muralidhar Singh (Madanapalle Institute of Technology & Science, Ram Krishna (India NIT Jamshedpur)

Broschiertes Buch

Advanced Materials Characterization

Basic Principles, Novel Applications, and Future Directions

Beschreibung

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

Produktdetails

• Advanced Materials Processing and Manufacturing
• Verlag: Taylor & Francis Ltd
• Seitenzahl: 144
• Erscheinungstermin: 29. November 2024
• Englisch
• Abmessung: 234mm x 156mm x 8mm
• Gewicht: 238g
• ISBN-13: 9781032375113
• ISBN-10: 1032375116
• Artikelnr.: 71912577